ZEISS XRM 730 Versa X-ray microCT
- 450nm spatial resolution
- ZEN navx user-centered guidance and control
- FAST mode with FPX
- Automated Filter Changer (AFC)
ZEISS XRM 730 Versa offers submicron imaging with 450-500 nm resolution across 30-160 kV with the exclusive 40x-Prime objective. Its ZEN navx automated user guidance and control system, optimize image quality, and speed throughput. Designed for accessibility, it supports a broad user spectrum, enabling advanced research capabilities.
特徴
High performance, sealed transmission source (30 – 160 kV, Max 25 W)
Variable Scanning Geometry, Tunable voxel sizes, Absorption contrast mode, Phase contrast mode, Wide Field Mode (WFM) for increased lateral tomography, Vertical Stitching for joining multiple tomographies vertically,
15 kg sample mass capacity: Sample Stage Travel (x45, y100, z50mm)
X-ray Scintillator coupled with 0.39x, 4x, 20x, 40XP objective, 2k x 2k pixel, noise suppressed charge-coupled detector, FlatPanel (FPX)