JEOL 1400 Flash Transmission Electron Microscope (TEM)

Acc. Voltage: 100 keV

An electron microscope that uses a beam of electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects.
 

Software: Limitless Panorama, for automated montaging of images.