Sasaki Changes the Sample
Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.
Free for anyone to re-use, but must be credited to OIST.
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