Sasaki Changes the Sample

7 Aug 2014
Poncie Rutsch
Sasaki Changes the Sample

Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.

Free for anyone to re-use, but must be credited to OIST.
This work is licensed under a Creative Commons Attribution 2.0 Generic License.

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