Bruker JPK Nanowizard4 Atomic Force Microscope AFM

High-resolution imaging with extreme performance PeakForce Tapping® for easy imaging Fast Scanning option with up to 150 lines/sec

Bruker JPK NanoWizard 4 AFM

Imaging modes

  • Now with PeakForce Tapping
  • Contact mode with lateral force microscopy (LFM)
  • Tapping Mode™ with PhaseImaging™

Force measurements

  • Static and dynamic spectroscopy
  • Advanced force mapping
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