Bruker JPK Nanowizard4 Atomic Force Microscope AFM
High-resolution imaging with extreme performance
PeakForce Tapping® for easy imaging
Fast Scanning option with up to 150 lines/sec
Imaging modes
- Now with PeakForce Tapping
- Contact mode with lateral force microscopy (LFM)
- Tapping Mode™ with PhaseImaging™
Force measurements
- Static and dynamic spectroscopy
- Advanced force mapping
Open to External Use?:
Yes
Operation:
User/Staff Operated