Scanning Electron Microscope SEM

In a scanning electron microscope (SEM), a focused electron beam scans the surface of a sample, generating signals such as secondary electrons, backscattered electrons, and characteristic X-rays, which are then detected and used to create high-resolution images and analyze the sample's composition and topography. FEG-SEM have advantages of producing a more coherent and brighter beam than thermionic gun with a smaller tip, improving resolution and reducing noise. The system is equipped with several detectors to perform imaging and characterization of the surface.