Multipurpose X-ray Diffractometer (XRD)

A Multipurpose X-ray Diffractometer employs X-ray diffraction techniques to analyse crystalline structures, making it suitable for investigating various materials. Its versatility extends beyond crystallography to examine amorphous materials, thin films, and powders, allowing researchers to gain insights into structural, compositional, and phase-related characteristics.

* Applications: Powder XRD, Thin film XRD, micro-XRD, XRR (X-ray reflectivity), GIXRD (Grazing Incidence XRD), HRXRD (High-Resolution XRD), Texture, Residual Stress, Phase identification, Quantitative phase analysis, Temperature-dependent XRD.