nnp N95-electrocharged filtration principle based face mask design using common materials Figure 6
Figure 6: Scanning Electron Microscopy (SEM) Micrograph images for OIST-made and commercial N-95 electrocharged layer sample at 500 micron resolution shows no discernible structural differences between the two samples. We are not specifying which of (a & b) are OIST-internal versus commercial N95 sample SEMs.
Date:
05 March 2024
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).
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