JEOL ARM200F Transmission Electron Microscope TEM
![ARM](/sites/default/files/styles/embed_lg_1x/public/2024-05/Jeol%20ARM200.jpg?itok=BxIdOKT4)
Manufacturer: JEOL
Model: JEM-ARM200F
Features:
Acc. Voltage: 200 keV
A device capable of observing atoms with high resolution, TEM mode and STEM mode (with Cs correction function), an EDX detector and an EELS detector. (Scanning resolution: 0.078 nm)
Inventory ID:
IMG-E002
Manufacturer:
JEOL
Model:
ARM200F
Year Installed:
2016
Category
Section
Open to External Use?:
Yes
Operation:
User/Staff Operated